Ultrafast (600 ps) ?-ray scintillators

Thin scintillators for ultrafast hard X-ray imaging

A multilayer thin-scintillator concept is described for ultrafast imaging. The individual layer thickness is determined by the spatial resolution and light attenuation length, the number of layers is determined by the overall efficiency. By coating the scintillators with a high quantum-efficiency photocathode, single X-ray photon detection can be achieved using fast scintillators with low light...

Scintillators Photomultipliers Crystal Scintillators Photomultipliers Gamma Ray Gamma Ray Scattered : Light Emitted Gamma Ray Absorbed : Light Emitted

Ultrafast X-ray Diffraction Theory

Time-resolved X-ray diffraction patterns can be inverted to obtain photoinduced dynamics without resorting to additional and often unknown information (e.g., potential energy surfaces), as required in optical probe experiments. In order to interpret ultrafast X-ray diffraction measurements, we consider several time scales in X-ray experiments involving elastic versus inelastic scattering, quant...

Optical simulation and experimental measurement of gamma ray energy spectrum of plastic scintillators with different sizes

The application of large plastic scintillators is widely increasing in the different areas of industry, medicine and security due to technical and economic advantages. One of the main disadvantages of these detectors is the unknown position of Compton edge at gamma ray spectrum. In this research, GEANT4/GATE code has been used to simulate the gamma ray spectrum for different volumes of large pl...

Structured CsI(Tl) Scintillators for X-ray Imaging Applications

We are developing large-area, thick, structured CsI(Tl) imaging sensors for a wide variety of X-ray imaging applications. Recently we have fabricated structured CsI(Tl) scintillators ranging from 30 μm (16 mg/cm) to 2000 μm (900 mg/cm) in thickness and up to 15 x 15 cm in area. Even 2000-μm-thick film showed well-controlled columnar growth throughout the film. Material characterization confirme...